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Industrial Quality Solutions
Research Microscopy Solutions
Across five fields of action, ZEISS is defining its responsibility for ensuring sustainable development.
for all challenges today
and tomorrow
A wide and flexible portfolio with
HD & SW package
Extensive future-proof accessories portfolio
Quality solutions experts and service always
at your side
Meeting the highest international standards
Leading expertise in Metrology, development, craftsmanship and extensive manufacturing
High-quality, robust components and
state-of-the art technologies
Consistent high standards for fast & effective
support in the production process
Turning data into productivity
Intelligent systems that pool and analyze digital information to enhance processes
Quality data with software that helps shaping
data sets as needed
Quick support for any problem through digital
Smart Service, reducing downtime
ZEISS Aerospace Solutions
Quality assurance is indispensable in the aerospace industry. ZEISS measuring systems deliver precise component geometries and material parameters to increase the safety of aircrafts, helicopters and spacecrafts.
ZEISS CMMs are used for inspecting complex geometries such as engine components or for assembling large airframes. The material properties generated are also used for finite element simulation, flow analysis and reverse engineering.
ZEISS eMobility Solutions
Holistic Quality Assurance for eMobility
Because of the large demand for electric vehicles all over the world, the automotive industry is seeing a rise of the electric engine and powertrain. This results in increasing demands on precision and poses new challenges to the quality assurance process.
ZEISS eMobility Solutions features a selection of products from the ZEISS portfolio, providing unique holistic quality inspection solutions for all components of E-Mobility: Battery, Power Electronics, E-Motor and Transmission – From energy to eMotion.
From Powder to Performance.
ZEISS 3D ManuFACT
ZEISS offers the perfect solution for each step in the additive manufacturing process – from material inspection of the powder all the way to final inspection of the finished workpiece. This is the only way to implement process improvements within the entire value-added chain for 3D printing while also ultimately increasing the number of in-spec parts.
Quality of assurance for the highest medical standards
Industrial Metrology provides data for the medical industry, thus making its contribution to the research, product development and quality assurance of further medical applications.
ZEISS measuring systems have already gained popularity in dentistry and deliver geometric data for implants – and they’re often used in prosthetics to develop prototypes that ensure a good fit. Inspections, modeling and simulations of plastic medical components can also be performed in many other medical applications.
Experience our broad portfolio of measuring services in our more than 60 locations worldwide. We offer a solution for your toughest measuring challenge so that you can focus on your core business.
As a comprehensive solutions provider, ZEISS remains at your side, independent of the purchase of a measuring system. From measuring services and training to enhanced application support – only ZEISS Industrial Quality Solutions is able to offer you the right expertise at all stages of the product life cycle.
Flexible and future-proof solutions
for all challenges today and tomorrow
Real-life performance guaranteed Bringing quality solutions to the production floor
Turning data into productivity
Complex demands in measuring technology require in-depth expertise and understanding. The utilization of state-of-the-art measuring machines enables us to find the ideal solution to each of your tasks. Be it contact, optical or industrial computed tomography; form, surface, contour or roughness – our state-of-the-art and flexible line of instruments enables fast and easy completion of your measuring tasks.
Contract Inspection/Programming
Backlog Measurement
Statistical Analysis
ZEISS Diamond!Scan®Styli made from the hardest material in the world.
Durable styli - no wear or deposits.
1. Fewer stylus systems changes required
ZEISS REACH CFX are very light weight and allow the assembly of more complex stylus systems, also on probes with strict weight limits.
2. Qualified for all measuring environments
ZEISS REACH CFX is thermally much more stable than aluminum and is up to 60 % more stiff than titanium. This delivers more accurate measurements even when scanning the workpiece or in the manufacturing environment.
3. Increased productivity
All extension in the portfolio are statically stiff with hardly any deflection compared to extensions made of titanium or aluminum. This allows faster scanning of the workpiece without losing accuracy.
4. Reliable results
The three stiffness levels available for REACH CFX extensions – CFX 1, CFX 3 and CFX 5 – ensure that you can always rely on your measuring results. Since they are matching the different CMM classes their accuracy is always kept on the highest possible level.
Setting angles made easy – the ZEISS FixAssist VAST helps you set-up stylus systems with a MT/VAST adapter plate. The angle around the CMM Z axis and about the horizontal axis can be adjusted accurately and repeatably.
Our high powered Xradia VERSA provides
state of the art µCT images. Find out more about what our services can provide you organization with R&D or high quality solutions.
Our METROTOM industrial CT scanner comes in many forms depending on your application requirement. Explore our product offering on our website.
Our VoluMax teams will generate a customized CT solution based on customer requirements. This solution can be fully integrated or manually fed depending on application. Reach out to any of our Customer Account Managers for more information.
X-ray Source
130kV / 39W (Hamamatsu)
Detector
1920 x 1536 pixel / 127 µm
Measurement Volume
D x h 190 x 130mm /
330 x 370mm
MPEE / MPESD
6,9 + L/100 / 2,9 + L/100
Max Load
5 kg
Size
3300 x 1900 x 2600mm
Weight
5700 kg
Window
Lead Glass
Electronic Cabinet
Separated
X-ray Source
225kV / 500W (Viscom)
Detector
1024 x 1024 pixel / 200 µm
1920 x 1536 pixel / 127 µm
Measurement Volume
D x h 170 x 150mm /
330 x 390mm
MPEE / MPESD
8,0 + L/100 / 4,0 + L/100
Max Load
5 kg
Size
3300 x 1900 x 2600mm
Weight
5200 kg
Window
Camera-Monitor
Electronic Cabinet
Integrated
X-ray Source
225kV / 500W (Viscom)
Detector
2048 x 2048 pixel / 200 µm
Measurement Volume
D x h 350 x 300mm /
570 x 550 (655) mm
MPEE / MPESD
9,0 + L/50 / 4,5 + L/50
Max Load
50 kg
Size
4150 x 1950 x 2650mm
Weight
7400 kg
Window
Camera-Monitor
Electronic Cabinet
Integrated
Advantages of Metrotomography
Seven fields, where Industrial CT overcomes standard metrological and inspection methods
Defect analysis: Aluminum pipe
Inspection of assemblies: Plastic bottle
Separation: EpiPen
Wall thickness analysis: Plastic cover
Nominal / actual comparison: Plastic levers
Dimensional measurement: Plastic cap
Reverse engineering: Plastic mold qual
Connection to VGStudio MAX or other evaluation tools​ recording all steps of process and applying to next parts
With CT technology you get full insights about the quality of your parts.
By entirely capturing your part, you can measure inner and outer structures and inspect defects beneath the surface. This reliable quality assurance can reduce costs by detecting defects.
With the ZEISS METROTOM 800 family you get solutions for any need.
Image samples using optical and electron microscopy and measure features automatically, including particle analysis, layer thickness, grain size, non-metallic inclusion analysis, and cast iron analysis. Polarized light or EDS can be used to identify materials of interest.
Optical, confocal or Scanning Electron Microscopy (SEM) can provide 3D non-contact topographic maps of the surface of your sample. Confomap or Zaphire software measures features and calculates surface texture parameters.
Use correlative workflows between ZEISS non-destructive X-ray microscopy, light microscopy, and electron microscopy with elemental analysis to identify the root cause of a failure.
Observe the sample with a variety of light microscopy techniques including polarized light, C-DIC, extended depth of field and 3D reconstruction.